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COMMENTS ON "APPLICATION OF FAULT FOLDING IN TEST GENERATION FOR LOGIC CIRCUITS"AGARWAL VK.1980; DIGIT. PROCESS.; CHE; DA. 1980; VOL. 6; NO 1; PP. 105-110; ABS. FRE/GER; BIBL. 8 REF.Article
COMMON MISCONCEPTIONS INDIGITAL TEST GENERATION.THOMAS JJ.1977; COMPUTER DESIGN; U.S.A.; DA. 1977; VOL. 16; NO 1; PP. 89-94; BIBL. 6 REF.Article
AN EXAMINATION OF ALGEBRAIC TEST GENERATION METHODS FOR MULTIPLE FAULTS.CARROLL BD; SHAH HG; JONES DM et al.1974; I.E.E.E. TRANS. COMPUTERS; U.S.A.; DA. 1974; VOL. 23; NO 7; PP. 743-745; BIBL. 7 REF.Article
TEST GENERATION ALGORITHMS FOR COMPUTER HARDWARE DESCRIPTION LANGUAGESLEVENDEL YK; MENON PM.1982; IEEE TRANS. COMPUT.; ISSN 0018-9340; USA; DA. 1982; VOL. 31; NO 7; PP. 577-588; BIBL. 22 REF.Article
TEST CALCULATION FOR LOGIC NETWORKS BY COMPOSITE JUSTIFICATIONSZIRAY J.1979; DIGIT. PROCESS; CHE; DA. 1979; VOL. 5; NO 1-2; PP. 3-15; ABS. FRE/GER; BIBL. 10 REF.Article
TEST GENERATION IN COMBINATIONAL NETWORKS BY DECOMPOSITION.PAPAIOANNOU SG.1976; COMPUTERS ELECTR. ENGNG.; G.B.; DA. 1976; VOL. 3; NO 4; PP. 387-394; BIBL. 6 REF.Article
A LOGIC SYSTEM FOR FAULT TEST GENERATION.AKERS SB JR.1976; I.E.E.E. TRANS. COMPUTERS; U.S.A.; DA. 1976; VOL. 25; NO 6; PP. 620-630; BIBL. 2 REF.Article
A NINE-VALUED CIRCUIT MODEL FOR TEST GENERATION.MUTH P.1976; I.E.E.E. TRANS. COMPUTERS; U.S.A.; DA. 1976; VOL. 25; NO 6; PP. 630-636; BIBL. 7 REF.Article
A DIAGNOSTIC MODEL FOR ANY-TYPE-FAULT TEST GENERATION IN SWITCHING CIRCUITSNOWICKI M.1980; DIGIT. PROCESS.; CHE; DA. 1980; VOL. 6; NO 1; PP. 69-74; ABS. FRE/GER; BIBL. 8 REF.Article
Test case generation according to the binary search strategyBEYDEDA, Sami; GRUHN, Volker.Lecture notes in computer science. 2003, pp 1000-1007, issn 0302-9743, isbn 3-540-20409-1, 8 p.Conference Paper
Layout influences testabilitySPENCER, T. H; SAVIR, J.IEEE transactions on computers. 1985, Vol 34, Num 3, pp 287-290, issn 0018-9340Article
On the acceleration of test generation algorithmsFUJIWARA, H; SHIMONO, T.IEEE transactions on computers. 1983, Vol 32, Num 12, pp 1137-1144, issn 0018-9340Article
Compression assessment based on medical image quality concepts using computer-generated test imagesKOCSIS, O; COSTARIDOU, L; MANDELLOS, G et al.Computer methods and programs in biomedicine. 2003, Vol 71, Num 2, pp 105-115, issn 0169-2607, 11 p.Article
Automated generation of unit tests for refactoringWALTER, Bartosz; PIETRZAK, Blazej.Lecture notes in computer science. 2004, pp 211-214, issn 0302-9743, isbn 3-540-22137-9, 4 p.Conference Paper
Comments on fault diagnosis of MOS combinational networksKUANG-WI CHIANG; VRANESIC, Z. G.IEEE transactions on computers. 1984, Vol 33, Num 10, issn 0018-9340, 947Article
Functional testing of microprocessorsDHANANJAY BRAHME; ABRAHAM, J. A.IEEE transactions on computers. 1984, Vol 33, Num 6, pp 475-485, issn 0018-9340Article
Stuck-at fault tests in the presence of undetectable bridging faultsYAMADA, T; NANYA, T.IEEE transactions on computers. 1984, Vol 33, Num 8, pp 758-761, issn 0018-9340Article
A practical approach to fault simulation and test generation for bridging faultsABRAMOVICI, M; MENON, P. R.IEEE transactions on computers. 1985, Vol 34, Num 7, pp 658-663, issn 0018-9340Article
Software-based diagnosis for processorsLI CHEN; DEY, Sujit.Design automation conference. 2002, pp 259-262, isbn 1-58113-461-4, 4 p.Conference Paper
Accélération de la génération destests de protocoles par agrégation de méthodes hétérogènes = Acceleration of test generation For protocols by merging heterogeneous methodsTouag, Athmane; Girault, Claude.2000, 165 p.Thesis
Embedded software-based self-testing for SoC designKRSTIC, A; LAI, W.-C; CHEN, L et al.Design automation conference. 2002, pp 355-360, isbn 1-58113-461-4, 6 p.Conference Paper
Proceedings/3rd Automatic test program generation workshop, San Francisco CA, March 15-16, 1983Automatic test program generation workshop. 3. 1983, 142 p., isbn 0-8186-0461-1Conference Proceedings
LEIRIOS test generator : Automated test generation from B modelsJAFUEL, Eddie; LEGEARD, Bruno.Lecture notes in computer science. 2006, pp 277-280, issn 0302-9743, isbn 978-3-540-68760-3, 1Vol, 4 p.Conference Paper
Test generation algorithms based on preorder relationsTSCHAEN, Valéry.Lecture notes in computer science. 2005, pp 151-171, issn 0302-9743, isbn 3-540-26278-4, 21 p.Conference Paper
Test sequence generation and model checking using dynamic transition relationsCAMPOS, Sérgio; GRUMBERG, Orna; YORAV, Karen et al.International journal on software tools for technology transfer (Print). 2004, Vol 6, Num 2, pp 174-182, issn 1433-2779, 9 p.Article